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Browsing by Subject Silicon
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Showing results 6 to 15 of 15
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Issue Date
Title
Author(s)
2003
Method for producing czochralski silicon free of agglomerated self-interstitial defects : U. S. Patent No. 6,635,587 B1
Mule’ Stagno, Luciano
;
Libbert, Jeffrey L.
;
Holzer, Joseph C.
2001
Method for producing czochralski silicon free of agglomerated self-interstitial defects : WO 01/21865 A1
Mule’ Stagno, Luciano
;
Libbert, Jeffrey L.
;
Holzer, Joseph C.
2002
Process for detecting agglomerated intrinsic point defects by metal decoration : U.S. Patent No. 6,391,662 B1
Mule’ Stagno, Luciano
;
Falster, Robert J.
2007
Process for making silicon wafers with stabilized oxygen precipitate nucleation centers : U. S. Patent No. 7,201,800 B2
Mule’ Stagno, Luciano
;
Libbert, Jeffrey L.
;
Phillips, Richard J.
;
Kulkarni, Milind
;
Banan, Mohsen
;
Brunkhorst, Stephen J.
2003
Process for suppressing the nucleation and/or growth of interstitial type defects by controlling the cooling rate through nucleation
McCallum, Kirk D.
;
Brock, Alexander W.
;
Banan, Mohsen
;
Falster, Robert J.
;
Holzer, Joseph C.
;
Johnson, Bayard K.
;
Bum Kim, Chang
;
Kimbel, Steven L.
;
Lu, Zheng
;
Metti, Paolo
;
Voronkov, Vladimir V.
;
Mule’ Stagno, Luciano
;
Libbert, Jeffrey L.
2003
Process for suppressing the nucleation and/or growth of interstitial type defects by controlling the cooling rate through nucleation : U. S. Patent Application Publication No. 2003/0196587 A1
McCallum, Kirk D.
;
Alexander, W. Brock
;
Banan, Mohsen
;
Falster, Robert J.
;
Holzer, Joseph C.
;
Johnson, Bayard K.
;
Bum Kim, Chang
;
Kimbel, Steven L.
;
Lu, Zheng
;
Mutti, Paolo
;
Voronkov, Vladimir V.
;
Mule’ Stagno, Luciano
;
Libbert, Jeffrey L.
2004
Silicon wafers with stabilized oxygen precipitate nucleation centers and process for making the same : U. S. Patent No. 6,808,781 B2
Mule’ Stagno, Luciano
;
Libbert, Jeffrey L.
;
Phillips, Richard J.
;
Kulkarni, Milind
;
Banan, Mohsen
;
Brunkhorst, Stephen J.
2006
Single crystal silicon wafer having an epitaxial layer substantially free from grown-in defects : U. S. Patent No. 7,097,718 B2
Mule’ Stagno, Luciano
;
Fei, Lu
;
Holzer, Joseph C.
;
Korb, Harold W.
;
Falster, Robert J.
2002
A technique for delineating defects in silicon
Mule’ Stagno, Luciano
2002
A theoretical and experimental analysis of macrodecoration of defects in monocrystalline silicon
Kulkarni, Milind S.
;
Libbert, Jeffrey L.
;
Keltner, Steven
;
Mule’ Stagno, Luciano