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Title: | Development of an new ASIC based, multi-channel data acquisition and real-time processing system |
Authors: | Seguna, Clive Gatt, Edward Grech, Ivan Casha, Owen De Cataldo, Giacinto |
Keywords: | Application-specific integrated circuits Fault tolerance (Engineering) Integrated circuits Redundancy (Engineering) |
Issue Date: | 2021 |
Publisher: | Institute of Electrical and Electronics Engineers |
Citation: | Seguna, C., Gatt, E., Grech, I., Casha, O. & De Cataldo, G. (2021). Development of an new ASIC based, multi-channel data acquisition and real-time processing system. 2021 22nd IEEE International Conference on Industrial Technology (ICIT), Valencia. |
Abstract: | This work presents the development of a newly Application Specific Integrated Circuit suitable for the simultaneous readout, real-time measurement, and processing of digital data in a multi-channel data acquisition system. High-speed multi-channel digitizers are useful for large-scale high-energy physics, astrophysics, nuclear and plasma physics experiments. The developed application specific integrated circuit allows the simultaneous continuous readout and processing of 240 12-bit analogue channels, at data transfer rates of 4.0 Gbps via five 3-lane Low-Voltage Differential Signaling transmitter drivers. Additionally, unlike the various vendor-defined high-speed digitizers that are currently available in the market, the developed ceramic quad flat 160-pin package microelectronic circuitry includes the implementation of an integrated fault tolerant and recoverable Triple-Modular Redundancy voting circuitry, use of Zero-suppression compression algorithm and implementation of Cyclic-Redundancy Check technique. The integration of such features reduces development time and enables the developed integrated circuitry to be used in a radiation physics environment where single-event upset or latch-up could lead to event data corruption or even electronic failures. The implemented system architecture lowers maintenance costs, and further improves system performance by ten-fold when compared for example to other various data acquisition readout electronic systems currently present in the A Large Ion Collider experiment in CERN. Additionally, the developed XFAB 180 nm 6-layer parallel readout integrated circuit architecture can be easily interfaced with other various vendor-specific analogue-to-digital convertor modules that are currently available on the market, thus further facilitating the upgrading process of data acquisition systems. |
URI: | https://www.um.edu.mt/library/oar/handle/123456789/104004 |
Appears in Collections: | Scholarly Works - FacICTMN |
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File | Description | Size | Format | |
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Development_of_an_New_ASIC_based_Multi-channel_Data_Acquisition_and_Real-Time_Processing_System_2021.pdf Restricted Access | 1.74 MB | Adobe PDF | View/Open Request a copy |
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