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https://www.um.edu.mt/library/oar/handle/123456789/143113| Title: | Determination of electrical aging test voltage level under a low-pressure environment for accurate lifetime prediction |
| Authors: | Ji, Yatai Giangrande, Paolo Zhao, Weiduo Madonna, Vincenzo Zhang, He Galea, Michael |
| Keywords: | Electric insulators and insulation -- Testing Electric discharges Electric machinery -- Reliability Electric machinery -- Windings Electromotive force -- Testing |
| Issue Date: | 2023-11 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| Citation: | Ji, Y., Giangrande, P., Zhao, W., Madonna, V., Zhang, H., & Galea, M. (2023, November). Determination of electrical aging test voltage level under a low-pressure environment for accurate lifetime prediction. In 26th International Conference on Electrical Machines and Systems (ICEMS), Zhuhai, China. 550-554. |
| Abstract: | Rapid growth of electric stress boosts the partial discharge (PD) risk of insulation and leads to electrical aging. For transportation applications (i.e., safety-critical), reliability is top-priority which means the lifetime of electrical machines (EMs) should be accurately estimated. Electrical aging of Type II insulated EMs caused by PD activity is greatly affected by ambient pressure. During accelerated aging tests, an improper test voltage selection might result in misleading lifetime estimation. In this paper, the allowable voltage levels are accurately determined by relying on aging tests under six different voltage levels at 600mbar, which gives a useful guideline for insulation design and the reliability of EMs could be accurately assessed. |
| URI: | https://www.um.edu.mt/library/oar/handle/123456789/143113 |
| Appears in Collections: | Scholarly Works - FacEngEE |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Determination of electrical aging test voltage level under a low pressure environment for accurate lifetime prediction.pdf Restricted Access | 475.81 kB | Adobe PDF | View/Open Request a copy |
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