Please use this identifier to cite or link to this item: https://www.um.edu.mt/library/oar/handle/123456789/138616
Title: Evaluation of strain variability of food microorganisms in response to decontamination by pulsed electric fields and thermal treatments
Authors: Lytras, Fotios
Psakis, Georgios
Gatt, Ruben
Hummerjohann, Joerg
Raso, Javier
Valdramidis, Vasilis
Keywords: Electric fields -- Industrial applications
Pulsed power systems
Escherichia coli
Listeria monocytogenes
Saccharomyces cerevisiae
Food -- Preservation
Issue Date: 2024
Publisher: Elsevier Ltd.
Citation: Lytras, F., Psakis, G., Gatt, R., Hummerjohann, J., Raso, J., & Valdramidis, V. (2024). Evaluation of strain variability of food microorganisms in response to decontamination by pulsed electric fields and thermal treatments. Innovative Food Science & Emerging Technologies, 95, 103731.
Abstract: The effect of pulsed electric fields (PEF) and thermal treatments on the inactivation of the population of 40 strains of 4 model microorganisms (Escherichia coli, Listeria monocytogenes, Lactiplantibacillus plantarum, Saccharomyces cerevisiae) were investigated. Microbial samples of McIlvaine buffer pH 7.0 were subjected to pulses with electric field strength 20 kV/cm and total specific energies (88, 136, and 184 kJ/kg). Depending on the species and strain, microorganisms exhibited various resistances. PEF microbial resistance and strain variability data were correlated to the total specific energy used. E. coli strains showed statistical log10 inactivation differences under the 88 and 136 kJ/kg but not under the 184 kJ/kg PEF treatment. In contrast, L. monocytogenes strains showed statistical log10 inactivation differences only under the 184 kJ/kg treatment. L. monocytogenes L6 strain was identified as the most resistant strain at PEF treatment (184 kJ/kg). This result was in accordance with the resistance under thermal treatment (62.8 °C, 30 min).
URI: https://www.um.edu.mt/library/oar/handle/123456789/138616
Appears in Collections:Scholarly Works - FacSciMet



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